Review paper 综述文章A review of lead-free solders for electronics applications
电子应用中无铅焊料的综述
Abstract
Ever since RoHS was implemented in 2006, Sn3.0Ag0.5Cu (SAC305) has been the primary lead-free solder for attaching electronic devices to printed circuit boards (PCBs). However, due to the 3.0 wt% Silver (Ag) in SAC305, companies have been looking at less expensive solder alternatives, especially for use in inexpensive products that have short operating lives and are used in mild application conditions. This paper reviews new lead-free solder alternatives and the trends in the industry, including SnCu-based solders, SnAgCu solders with Ag content < 1.0 wt%, SnAg solders, and no-Ag low-temperature solders (e.g., SnBi-based solders). The analysis is conducted for reflow, wave, and rework conditions and for packaged and flip-chip devices.
自 2006 年 RoHS 指令实施以来,Sn3.0Ag0.5Cu(SAC305)一直是将电子设备焊接到印刷电路板(PCB)上的主要无铅焊料。然而,由于 SAC305 中银(Ag)含量为 3.0 wt%,企业开始寻求更经济实惠的焊料替代方案,尤其是在成本较低、使用寿命较短且工作环境较为温和的应用场景中。本文回顾了新型无铅焊料替代品及行业趋势,包括锡铜基焊料、银含量<1.0 wt%的锡银铜焊料、锡银焊料,以及无银低温焊料(如锡铋基焊料)。分析涵盖回流焊、波峰焊、返工条件,以及封装和倒装芯片器件。
自 2006 年 RoHS 指令实施以来,Sn3.0Ag0.5Cu(SAC305)一直是将电子设备焊接到印刷电路板(PCB)上的主要无铅焊料。然而,由于 SAC305 中银(Ag)含量为 3.0 wt%,企业开始寻求更经济实惠的焊料替代方案,尤其是在成本较低、使用寿命较短且工作环境较为温和的应用场景中。本文回顾了新型无铅焊料替代品及行业趋势,包括锡铜基焊料、银含量<1.0 wt%的锡银铜焊料、锡银焊料,以及无银低温焊料(如锡铋基焊料)。分析涵盖回流焊、波峰焊、返工条件,以及封装和倒装芯片器件。
Introduction
SnPb solder has been used for assembling electronics for > 50 years due to its good soldering properties, manufacturability, reliability, and pricing. Lead, however, is toxic to humans. As a result, legislation on end-of-life disposal and the European Union's (EU) Restriction of Hazardous Substances (RoHS) Directive led to the elimination of SnPb solder from consumer electronics sold in EU markets [1], and later from other products in other countries, such as China [2], Japan [3], South Korea [4], Turkey [5], and the United States [6].
锡铅焊料(SnPb)因其良好的焊接性能、可制造性、可靠性和价格优势,已被用于电子组装超过 50 年。然而,铅对人类具有毒性。因此,关于废弃物处置的立法以及欧盟(EU)的《限制有害物质指令》(RoHS)导致含 SnPb 焊料的消费类电子产品在欧盟市场被淘汰[1],随后其他国家如中国[2]、日本[3]、韩国[4]、土耳其[5]和美国也相继禁止使用[6]。[6]。
锡铅焊料(SnPb)因其良好的焊接性能、可制造性、可靠性和价格优势,已被用于电子组装超过 50 年。然而,铅对人类具有毒性。因此,关于废弃物处置的立法以及欧盟(EU)的《限制有害物质指令》(RoHS)导致含 SnPb 焊料的消费类电子产品在欧盟市场被淘汰[1],随后其他国家如中国[2]、日本[3]、韩国[4]、土耳其[5]和美国也相继禁止使用[6]。[6]。
When the deadline for implementation of the RoHS legislation was approaching in 2006, the leading two alternatives to the common SnPb solder were SnAgCu eutectic and SnCu eutectic, both considered acceptable by academia and industry consortia in Europe, Japan, and the United States. However, concerns about the cost of the Iowa State University patent [7] covering SnAgCu eutectic and the higher cost of Ag prompted the Japan Electronic Industry Development Association (JEIDA, now JEITA) to endorse the hypoeutectic SAC305 alloy, which was then covered by a Japanese patent held by Senju Metal Industries (patent no. 3027441). The melting point (217 °C) of SAC305 was seen to be an advantage over the higher melting point (227 °C) of most SnCu alloys; and SAC305 performs similarly to high-Ag SnAgCu eutectic but is less expensive [8]. Therefore, a decision by the IPC to endorse SAC305 as “the lead-free alloy of choice for the electronics industry” [8] prompted U.S. companies to adopt the SAC305 alloy as their first choice for products sold to the EU markets. The decision resulted in SAC305 largely displacing the SnCu and SnAgCu eutectic as the industry choice and helped third-party sources develop reliability databases for SAC305. This availability of reliability data helped SAC305 become the de facto standard Pb-free solder.
当 2006 年《限制含有害物质指令》(RoHS 指令)的实施截止日期临近时,替代传统锡铅焊料(SnPb)的两大主流方案是锡银铜共晶焊料(SnAgCu eutectic)和锡铜共晶焊料(SnCu eutectic)。这两种方案均被欧洲、日本和美国的学术界及行业联盟认为是可接受的替代方案。然而,由于爱荷华州立大学持有的 SnAgCu 共晶焊料专利[7]的成本问题,以及银成本较高的因素,日本电子工业发展协会(JEIDA,现为 JEITA)推荐了由千寿金属工业公司持有的日本专利(专利号 3027441)覆盖的亚共晶 SAC305 合金。SAC305 的熔点(217°C)被认为优于大多数 SnCu 合金的较高熔点(227°C);且 SAC305 与高银含量 SnAgCu 共晶合金性能相当,但成本更低[8]。因此,国际电子元器件制造商协会(IPC)决定将 SAC305 认定为“电子行业首选无铅合金”[8],促使美国企业将其作为出口欧盟市场的产品首选合金。该决策导致 SAC305 合金在行业中逐步取代 SnCu 和 SnAgCu 共晶合金,并促使第三方机构建立 SAC305 的可靠性数据库。这些可靠性数据的可用性使 SAC305 成为事实上的无铅焊料标准。
当 2006 年《限制含有害物质指令》(RoHS 指令)的实施截止日期临近时,替代传统锡铅焊料(SnPb)的两大主流方案是锡银铜共晶焊料(SnAgCu eutectic)和锡铜共晶焊料(SnCu eutectic)。这两种方案均被欧洲、日本和美国的学术界及行业联盟认为是可接受的替代方案。然而,由于爱荷华州立大学持有的 SnAgCu 共晶焊料专利[7]的成本问题,以及银成本较高的因素,日本电子工业发展协会(JEIDA,现为 JEITA)推荐了由千寿金属工业公司持有的日本专利(专利号 3027441)覆盖的亚共晶 SAC305 合金。SAC305 的熔点(217°C)被认为优于大多数 SnCu 合金的较高熔点(227°C);且 SAC305 与高银含量 SnAgCu 共晶合金性能相当,但成本更低[8]。因此,国际电子元器件制造商协会(IPC)决定将 SAC305 认定为“电子行业首选无铅合金”[8],促使美国企业将其作为出口欧盟市场的产品首选合金。该决策导致 SAC305 合金在行业中逐步取代 SnCu 和 SnAgCu 共晶合金,并促使第三方机构建立 SAC305 的可靠性数据库。这些可靠性数据的可用性使 SAC305 成为事实上的无铅焊料标准。
The cost of SAC305 solder, however, is a concern due to the high cost of Ag. As of 2016, Sn cost about $18.83/kg and Ag cost about $657.15/kg [9], thus making the solder bar cost around $40/kg, which is 3 times higher than the cost in 2006. As a result, the electronics industry has been looking for less expensive alternatives to SAC305. Unfortunately, while there are numerous alternatives to SAC305, reliability studies on these alternatives have been minimal.
然而,SAC305 焊料的成本是一个问题,因为银的价格很高。截至 2016 年,锡的价格约为$18.83/kg,银的价格约为$657.15/kg [9],因此焊料棒的价格约为$40/kg,这是 2006 年成本的 3 倍。因此,电子行业一直在寻找 SAC305 的替代品。遗憾的是,尽管存在多种 SAC305 替代品,但对这些替代品的可靠性研究尚不充分。
然而,SAC305 焊料的成本是一个问题,因为银的价格很高。截至 2016 年,锡的价格约为$18.83/kg,银的价格约为$657.15/kg [9],因此焊料棒的价格约为$40/kg,这是 2006 年成本的 3 倍。因此,电子行业一直在寻找 SAC305 的替代品。遗憾的是,尽管存在多种 SAC305 替代品,但对这些替代品的可靠性研究尚不充分。
The less expensive alternatives to SAC305 considered by the industry are SnCu-based solders and SAC solders with Ag content < 1%. There is a continued interest in the SnCu eutectic since it was found that a trace of Ni could turn it into a user-friendly wave solder alloy. SnCu has thus gained a substantial market share and is used in selective soldering and hot air solder leveling. Several versions of these alternatives with additives such as Ni, Bi, Ge, Co, and Mn are also available.
行业中考虑的 SAC305 的廉价替代品包括锡铜基焊料和银含量低于 1%的 SAC 焊料。由于发现微量镍可使其转化为易于使用的波峰焊合金,锡铜共晶焊料仍备受关注。因此,锡铜焊料已占据相当大的市场份额,并被用于选择性焊接和热风整平工艺。此外,还可提供添加 Ni、Bi、Ge、Co 和 Mn 等添加剂的多种版本。
行业中考虑的 SAC305 的廉价替代品包括锡铜基焊料和银含量低于 1%的 SAC 焊料。由于发现微量镍可使其转化为易于使用的波峰焊合金,锡铜共晶焊料仍备受关注。因此,锡铜焊料已占据相当大的市场份额,并被用于选择性焊接和热风整平工艺。此外,还可提供添加 Ni、Bi、Ge、Co 和 Mn 等添加剂的多种版本。
This paper discusses various alternative lead-free solders for targeted electronics applications. Section 2 discusses the considerations for developing new lead-free solders such as physical and chemical characteristics (e.g., the melting temperatures, flux chemistry, mechanical properties), manufacturing, reliability, costs, and regulations. Section 3 discusses considerations specific to soldering applications, including solder bumps for device packages and the wave, reflow, and hand soldering used to assemble (connect using solder) device packages to printed circuit boards (PCBs). Section 4 presents the characteristics of the common additives to solder and their influence on solder reliability, and then overviews the characteristics (e.g., composition and melting temperature) of alternative lead-free solders with/without additives. The industry best practices for low-cost lead-free solders in various forms and for different soldering applications are also explained in this section. Section 5 describes the industry trends in solder selection. Section 6 presents the conclusions and the challenges to developing new lead-free alternatives.
本文讨论了适用于特定电子应用的各种无铅焊料替代方案。第 2 节讨论了开发新型无铅焊料时需要考虑的因素,包括物理和化学特性(如熔点、助焊剂化学成分、机械性能)、制造工艺、可靠性、成本及法规要求。第 3 节讨论了焊接应用中的特定考虑因素,包括器件封装中的焊料凸点,以及用于将器件封装与印刷电路板(PCB)连接(通过焊料连接)的波峰焊、回流焊和手工焊工艺。第 4 节介绍了焊料中常见添加剂的特性及其对焊料可靠性的影响,并概述了含/不含添加剂的替代无铅焊料的特性(如成分和熔点)。本节还解释了各种形式的低成本无铅焊料在不同焊接应用中的行业最佳实践。第 5 节描述了焊料选择的行业趋势。第 6 节提出了开发新无铅替代品的结论和挑战。
本文讨论了适用于特定电子应用的各种无铅焊料替代方案。第 2 节讨论了开发新型无铅焊料时需要考虑的因素,包括物理和化学特性(如熔点、助焊剂化学成分、机械性能)、制造工艺、可靠性、成本及法规要求。第 3 节讨论了焊接应用中的特定考虑因素,包括器件封装中的焊料凸点,以及用于将器件封装与印刷电路板(PCB)连接(通过焊料连接)的波峰焊、回流焊和手工焊工艺。第 4 节介绍了焊料中常见添加剂的特性及其对焊料可靠性的影响,并概述了含/不含添加剂的替代无铅焊料的特性(如成分和熔点)。本节还解释了各种形式的低成本无铅焊料在不同焊接应用中的行业最佳实践。第 5 节描述了焊料选择的行业趋势。第 6 节提出了开发新无铅替代品的结论和挑战。
Section snippets
Considerations for development of lead-free solders
The development of an alternative to SAC305 must consider solder properties, mechanical and reliability properties of the solder joint, costs, and regulations. The transition to a low-cost alternative to SAC305 solder requires step-by-step development ranging from research on the probable solder materials to subsequent process development and qualification, process transfer, inventory purge, and product qualification [10].
开发 SAC305 的替代品必须考虑焊料性能、焊点机械性能和可靠性、成本以及相关法规。向低成本 SAC305 焊料替代品的过渡需要分阶段进行,包括从潜在焊料材料的研究到后续工艺开发和验证、工艺转移、库存清理以及产品验证[10]。
开发 SAC305 的替代品必须考虑焊料性能、焊点机械性能和可靠性、成本以及相关法规。向低成本 SAC305 焊料替代品的过渡需要分阶段进行,包括从潜在焊料材料的研究到后续工艺开发和验证、工艺转移、库存清理以及产品验证[10]。
Requirements specific to soldering applications
Except for the common requirements discussed in Section 2, first-level interconnects (FLIs) between the die and package, and second-level interconnects (SLIs) between the package and motherboard, have specific requirements depending on the various soldering applications or processes, such as solder bumping, reflow soldering, wave soldering, and hand soldering.
Current low-cost lead-free solders and additives
Lead-free solder alternatives have been studied or investigated by academia or industry for years. Electronics assembly and manufacturing companies select the solders for their applications based on the assembly processes, cost, and reliability requirements, as well as requests by their customers. Adding reactive or non-reactive elements/particles into solder alloys is widely used by researchers and manufacturers to improve the performance of solder alloys or develop new solder alloys. This
无铅焊料的替代方案多年来一直是学术界和工业界研究的重点。电子组装和制造企业会根据组装工艺、成本、可靠性要求以及客户需求,选择适合其应用的焊料。研究人员和制造商广泛采用在焊料合金中添加反应性或非反应性元素/颗粒的方法,以提升焊料合金的性能或开发新型焊料合金。
无铅焊料的替代方案多年来一直是学术界和工业界研究的重点。电子组装和制造企业会根据组装工艺、成本、可靠性要求以及客户需求,选择适合其应用的焊料。研究人员和制造商广泛采用在焊料合金中添加反应性或非反应性元素/颗粒的方法,以提升焊料合金的性能或开发新型焊料合金。
Industry trends in lead-free solders
Electronic components such as flip chips are becoming smaller and smaller with more powerful functions. This trend requires components to have reliable connections under very fine pitches and lower gap conditions. In addition, minimization of the components and high-density placements on the PCBs create challenges for SLIs. This section discusses the trends in the lead-free solders to meet the FLI and SLI requirements for electronics applications.
电子元件如倒装芯片正朝着小型化、功能强大的方向发展。这一趋势要求元件在极细间距和更小间隙条件下具备可靠的连接性能。此外,元件的 miniaturization 和 PCB 上高密度布局为 SLI 带来了挑战。本节讨论无铅焊料的最新趋势,以满足电子应用中 FLI 和 SLI 的要求。
电子元件如倒装芯片正朝着小型化、功能强大的方向发展。这一趋势要求元件在极细间距和更小间隙条件下具备可靠的连接性能。此外,元件的 miniaturization 和 PCB 上高密度布局为 SLI 带来了挑战。本节讨论无铅焊料的最新趋势,以满足电子应用中 FLI 和 SLI 的要求。
Conclusions and requirements for future developments
This paper investigated the lead-free alternatives to SAC305 that the industry has been implementing and the effects that these alternatives will have on new product reliability and future product development. Among the available alternative alloys to SAC305, the two main sets of alloys are those that contain no Ag, including SnCu + additives alloys, and SAC alloys that contain low amounts of Ag (0.1, 0.3, 0.8, 1.0 wt%) with and without additives. SnCu solders with dopants (Ni, Ge, Co, and Bi) are
本文研究了行业正在采用的 SAC305 无铅替代品及其对新产品可靠性和未来产品开发的影响。在可用的 SAC305 替代合金中,主要分为两类:一类是不含银的合金,包括锡铜合金(SnCu)及添加剂合金;另一类是含低量银(0.1%、0.3%、0.8%、1.0%)的 SAC 合金,其中部分合金含有添加剂。添加了掺杂元素(镍、锗、钴和铋)的锡铜焊料(SnCu)是
本文研究了行业正在采用的 SAC305 无铅替代品及其对新产品可靠性和未来产品开发的影响。在可用的 SAC305 替代合金中,主要分为两类:一类是不含银的合金,包括锡铜合金(SnCu)及添加剂合金;另一类是含低量银(0.1%、0.3%、0.8%、1.0%)的 SAC 合金,其中部分合金含有添加剂。添加了掺杂元素(镍、锗、钴和铋)的锡铜焊料(SnCu)是
Disclaimer of endorsement
Reference herein to any specific commercial products, process, or service by trade name, trademark, manufacturer, or otherwise, does not necessarily constitute or imply its endorsement, recommendation, or favoring by the authors, the University of Maryland or Intel. The views and opinions of authors expressed herein do not necessarily state or reflect those of the University of Maryland or Intel, and shall not be used for advertising or product endorsement purposes.
本文中提及的任何特定商业产品、工艺或服务,无论是以商标名称、商标、制造商或其他方式提及,均不必然构成或暗示作者、马里兰大学或英特尔对其的认可、推荐或偏好。本文中作者表达的观点和意见不必然代表马里兰大学或英特尔的观点或意见,且不得用于广告或产品推荐目的。
本文中提及的任何特定商业产品、工艺或服务,无论是以商标名称、商标、制造商或其他方式提及,均不必然构成或暗示作者、马里兰大学或英特尔对其的认可、推荐或偏好。本文中作者表达的观点和意见不必然代表马里兰大学或英特尔的观点或意见,且不得用于广告或产品推荐目的。
Acknowledgments
The authors would like to thank the > 150 companies and organizations that support research activities at the Center for Advanced Life Cycle Engineering (CALCE) at the University of Maryland annually. We also thank Keith Howell and Keith Sweatman from Nihon Superior, Manabu Itoh and Shantanu Joshi from Koki Company Limited, Jack Maccarone and Scott Lewin from Alpha Metals, Ayano Kawa and Derek Daily from Senju, Anny Zhang and Ning-Cheng Lee from Indium Corp., and Preeti Chauhan, Steve Folsom,
References (193)
- et al.
Associations of neonatal lead, cadmium, chromium and nickel co-exposure with DNA oxidative damage in an electronic waste recycling town
Sci. Total Environ.
(2014) - et al.
Development of high-temperature solders: review
Microelectron. Reliab.
(2012) - et al.
Drop failure modes of Sn − 3.0Ag − 0.5Cu solder joints in wafer level chip scale package
Trans. Nonferrous Metals Soc. China
(2016) - et al.
Mechanical properties of Pb-free SnAg solder joints
Acta Mater.
(2011) - et al.
Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints
Microelectron. Reliab.
(2001) - et al.
Drop impact reliability testing for lead-free and lead-based soldered IC packages
Microelectron. Reliab.
(2006) - et al.
Study of electromigration-induced formation of discrete voids in flip-chip solder joints by in-situ 3D laminography observation and finite-element modeling
Acta Mater.
(2016) - et al.
Effect of voids on the reliability of BGA/CSP solder joints
Microelectron. Reliab.
(2003) - et al.
Thermal behavior and microstructure of the intermetallic compounds formed at the Sn-3Ag-0.5Cu/Cu interface after soldering and isothermal aging
J. Cryst. Growth
(2006) - et al.
Creep of thermally aged SAC solder joints
Microelectron. Reliab.
(2007)
Transition from flip chip solder joint to 3D IC microbump: its effect on microstructure anisotropy
Microelectron. Reliab.
(2013)
RoHS compliance in safety and reliability critical electronics
Microelectron. Reliab.
(2016)
Tin whisker analysis of an automotive engine control unit
Microelectron. Reliab.
(2014)
Tin whisker analysis in an automotive engine control unit
Microelectron. Reliab.
(2014)
Effect of surface finishes on electromigration reliability in eutectic Sn–58Bi solder joints
Microelectron. Eng.
(2014)
A review: on the development of low melting temperature Pb-free solders
Microelectron. Reliab.
(2014)
Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn–Cu intermetallic compound layers
Microelectron. Reliab.
(2009)
Impurity and alloying effects on interfacial reaction layers in Pb-free soldering
Mater. Sci. Eng. R
(2010)
Effects of minor Fe, Co, and Ni additions on the reaction between SnAgCu solder and Cu
J. Alloys Compd.
(2009)
Effects of Co and Ni addition on reactive diffusion between Sn–3.5Ag solder and Cu during soldering and annealing
Mater. Sci. Eng. A
(2006)
Directive 2002/95/EC of the European Parliament and of the Council
Management Methods for Restriction of the Use of Hazardous Substances in Electrical and Electronic Products
J-Moss (Japanese RoHS)
Act for Resource Recycling of Electrical and Electronic Equipment and Vehicles
Turkey Announces RoHS Legislation
Restrictions on the Use of Certain Hazardous Substances (RoHS) in Electronic Devices
Solder Value Final Report.indd - IPC
London Metal Exchange
Effects of SAC Alloy Copper Dissolution Rates on PTH Processes: Cost and Performance Justify Use of Certain Alternatives to SAC305/405
The miniaturization technologies: past, present, and future
IEEE Trans. Ind. Electron.
(1995)
A dynamic circuit model of a small direct methanol fuel cell for portable electronic devices
IEEE Trans. Ind. Electron.
(2010)
Intelligent and universal fast charger for Ni-Cd and Ni-MH batteries in portable applications
IEEE Trans. Ind. Electron.
(2004)
Packaging technology for electronic applications in harsh high temperature environments
IEEE Trans. Ind. Electron.
(2011)
Robust BME Class-I MLCCs for harsh-environment applications
IEEE Trans. Ind. Electron.
(2011)
SiC devices for advanced power and high-temperature applications
IEEE Trans. Ind. Electron.
(2011)
SMART Group, “Solder Dross,” EMT Worldwide
Long-term toxicity of 213Bi-labelled BSA in mice
PLoS ONE
(2016)
The effects of trace amounts of lead on the reliability of six lead-free solders
High lead solder (over 85%) solder in the electronics industry: RoHS exemptions and alternatives
J. Mater. Sci. Mater. Electron.
(2015)
Thermal stress of surface oxide layer on micro solder bumps during reflow
J. Electron. Mater.
(2015)
Acceptability of Electronic Assemblies
(2014)
Prognostication of residual life and latent damage assessment in lead-free electronics under thermomechanical loads
IEEE Trans. Ind. Electron.
(2011)
Thermomechanical durability of high I/O BGA packages
High cycle cyclic torsion fatigue of PBGA Pb-free solder joints
IEEE Trans. Compon. Packag. Technol.
(2007)
Test methodology for durability estimation of surface mount interconnects under drop testing conditions
Microelectron. Reliab.
(2007)
Drop testing of printed wiring assemblies
Vibration durability assessment of Sn3.0Ag0.5Cu & Sn37Pb solders under harmonic excitation
Packaging and integration technologies for future high-frequency power supplies
IEEE Trans. Ind. Electron.
(2004)
Test Method for Lead-free solders – Part 6: Methods for 45° Pull Test of Solder Joints on QFP Lead
(2003)
Cited by (430)
Die attachment, wire bonding, and encapsulation process in LED packaging: A review
2021, Sensors and Actuators A PhysicalHighly mechanical and high-temperature properties of Cu–Cu joints using citrate-coated nanosized Ag paste in air
2021, Progress in Natural Science Materials InternationalEco-Friendly Electronics—A Comprehensive Review
2022, Advanced Materials TechnologiesOnline Thermal Resistance and Reliability Characteristic Monitoring of Power Modules with Ag Sinter Joining and Pb, Pb-Free Solders during Power Cycling Test by SiC TEG Chip
2021, IEEE Transactions on Power Electronics
© 2017 Elsevier Ltd. All rights reserved.
