Abstract 抽象
The harmful effects of lead on the environment and human health, coupled with the threat of legislation, have prompted a serious search for lead-free solders for electronic packaging applications. At present, Sn-Pb eutectic and other Pb-containing solders find widespread use in printed circuit board assembly. Several Pb-free solder alloys which appear to have the potential for replacing Sn-Pb solders are receiving increased attention from the electronic assembly community. Recently, numerous studies have been published detailing the wetting characteristics, tensile and shear strength, and creep and low-cycle fatigue properties of these alloys. It is the purpose of this paper to review these results and assess the suitability of the solders for electronic packaging from the viewpoints of process technology and reliability.
铅对环境和人类健康的有害影响,加上立法的威胁,促使人们认真寻找用于电子封装应用的无铅焊料。目前,Sn-Pb 共晶和其他含铅焊料在印刷电路板组装中得到广泛应用。几种似乎有可能取代 Sn-Pb 焊料的无铅焊料合金越来越受到电子组装界的关注。最近,发表了大量研究,详细介绍了这些合金的润湿特性、拉伸和剪切强度以及蠕变和低周疲劳性能。本文旨在从工艺技术和可靠性的角度对这些结果进行综述,并评估焊料在电子封装中的适用性。
Similar content being viewed by others
其他人正在查看的类似内容
Explore related subjects
探索相关主题
Discover the latest articles and news from researchers in related subjects, suggested using machine learning.发现相关学科研究人员的最新文章和新闻,建议使用机器学习。
References 引用
Binary Alloy Phase Diagrams, ed. T.B. Massalski, (Materials Park, OH: American Society for Metals, 1987), p. 1848.
二元合金相图 ,T.B. Massalski 编辑,(俄亥俄州材料园:美国金属协会,1987 年),第 1848 页。B. Roos-Kozel,Surface Mount Technology Tech. Mono. 6984- 002 (Silver Spring, MD: ISHM, 1986), p.115.
B. Roos-Kozel, 表面贴装技术技术。6984-002(马里兰州银泉:ISHM,1986 年),第 115 页。D. Romm and N. McLellan,Surface Mount Tech. Jan. 35 (1993).
D. Romm 和 N. McLellan, 表面贴装技术,1 月 35 日(1993 年)。D. Heller, J. Leonard and J. Neville,Elec. Packg. & Prod. Dec. 58 (1992).
D. Heller、J. Leonard 和 J. Neville,Elec. Packg. &; Prod.,12 月 58 日(1992 年)。M. Warwick,Circuits Assembly June, 60 (1992).
M. Warwick, 电路大会 ,60 年 6 月 (1992)。L. Matienzo, F. Emmi and R. Johnson,Principles of Electronic Packaging, ed., D. Seraphim, (McGraw-Hill, 1989), p. 731.
L. Matienzo、F. Emmi 和 R. Johnson, 电子封装原理 ,D. Seraphim 编辑,(McGraw-Hill,1989 年),第 731 页。S. Pattanaik and V. Raman,Proc. Mat. Dev. in Microelec. Packg. Conf. (Materials Park, OH: ASM Intl., 1991), p. 251.
S. Pattanaik 和 V. Raman,Proc. Mat. Dev. in Microelec.包装。会议。(俄亥俄州材料园:ASM Intl.,1991 年),第 251 页。R. N. Wild,Proc. Inter. NEPCON Conf. Briton, 1971, p. 81.
J.R. Getten and R. Senger,IBM J. Res. Devel. 26, 379 (1982).
D. Lazzarini and F. Sarnacki, Water Solubile Fluxes, U. S. Patent, 4,000,016, Dec. 28, 1976.
H. Gudul and R. Calson,Elec. Packg. & Prod. Sept., 29 (1992).
J. Phillips and K. Stillahn,Elec. Packg. & Prod. Feb., 78 (1992).
C. Mackay and W. von Voss,Mater. Sci. and Tech. 1 (3) 240 (1985).
M. Ackroyd et al.,Metals Tech. Feb., 73 (1975).
D.M. Jarboe,Thermal Fatigue Evaluation of Solder Alloys, NTIS, U. S. Dept. of Commerce, BDX-613-2341, Feb. 1980.
P. Vianco and D. FrearJOM, July, 14 (1993).
L. Felton et al.,JOM July, 28 (1993).
Z. Mei and J. Morris, Jr.,J. Electron. Mater. 21, 599 (1992).
J. Seyyedi,J. Elec. Packg. 115, 305 (1993).
D. Tribula and J.W. Morris, Jr.,J. Elec. Packag., Trans. ASME 112, 87 (1990).
Z. Mei and J. Morris, Jr.,J. Electron. Mater. 21, 401 (1992).
F. Ojebuoboh,JOM 44, (4) 46 (1992).
N. Koopman et al.,Microelectronics Packaging Handbook, ed., R. Tummala (Van Nostrand Reinhold, 1989), p. 361.
J.S. Corbin,IBM J. Res. Devel. 37, (5), 585 (1993).
M.D. Ries et. al.,IBM J. Res. Devel. 37 (5), 597 (1993).
S. Konecke, private communication, Loral Co., Manassas, MD.
H. Hattori et al., U. S. Patent, 4,480,261, Oct. 30, 1984.
T. Lombardi et al.,IBM Tech. Discl. Bull. 34 (7A) 308 (1991).
L. Rice and A. Roberti,IBM Tech. Discl. Bull. 26 (11) 6092 (1984).
C.J. Thwaites,Brazing and Soldering (11) 22 (1986).
J. Fischer et al.,Proc. Nat. Elec. Pack. & Prod. Conf. 2, 1056 (1992).
S.J. Nightingale and O. Hudson,Tin Soldiers, (British Non- Ferrous Metals Res. Assn. Monograph, 1942), p. 1.
R. J. Klein Wassink,Soldering in Electronics (Electrochemical Pub. Ltd., 1989), p. 123.
W.A. Baker,J. Inst. Metals 65, 277 (1939).
W. Allen and J. Perepezko,Script Met. 24, 2215 (1990).
H. H. Manko,Solders and Soldering, 3rd ed. (McGraw-Hill, 1992) pp. 128, 143.
B. Predel and W. Schwermann,J. Inst. Metals, 99,169 (1971).
S.K. Kang,Met. Trans. 12B, 620 (1981).
W. Tomlinson and A. Fullylove,J. Mat. Sci. 27, 5777 (1992).
M. Harada and R. Satoh,IEEE Trans. CHMT 13 (4), 736 (1990).
T. Ogashiwa et al.,Jpn. J. Appl. Phys. 31,761, Part 1, (1992).
O. Chirino and R. Romanosky,IBM Tech. Discl. Bull. 23 (8), 3620(1981).
R. Herdzik and N. Koopman,IBM Tech. Discl. Bull. 20 (4), 1394(1977).
M. McCormack et al.,Appl. Phys. Lett. 63 (1), 15 (1993).
B.R. Allenby et al.,Proc. Surface Mount Int., San Jose, CA, Aug. 1992, Vol.1, p.l.
J.T. Yeh,Met. Trans. A 13A, 1547 (1982).
K. Fujiwara and M. Ashai,IEEE Trans. Comp. Hybrd. & Mfg. Tech., CHMT-10, 263 (1987).
C.E. White,Adv. Mat. and Proc, Metal Progress, Dec, 69 (1986).
R. Darveaux and I. Turlik,Proc. IEEE 2nd Intersociety Conf. on Thermal Phenomena in Electronic Systems, Las Vegas, NV, May 1990, p. 40.
L.S. Goldman et al.,IEEE Trans. Parts. Hybrd. & Pkg. PHP- 13, Sept., 25 (1977).
R.T. Howard,IBM J. Res. Devel. 26, 372 (1982).
K.J. Puttlitz,IEEE Trans. Comp. Hybrd. & Mfg. Tech. 13,188 (1990).
R. Wild,INTERNEPCON Brighton, England, October 1975.
Indium Corporation of America, Utica, NY 13503.
H. Rack and J. Maurin,J. Testing and Eval. 2, 351 (1974).
L. Wilson and R. Buckner,Trans. ASM 57, 346 (1964).
W. Reichenecker,ME June, 12 (1983).
W.J. Tomlinson and I. Collier,J. Mater. Sci. 22 (1987).
Rights and permissions
About this article
Cite this article
Kang, S.K., Sarkhel, A.K. Lead (Pb)-free solders for electronic packaging. J. Electron. Mater. 23, 701–707 (1994). https://doi.org/10.1007/BF02651362
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02651362

